Product Description

The near infrared CONTOUR-IR camera is designed for observation, registration and recording radiation in near infrared zone in 400-1700 nm spectral region emitted by infrared sources such as GaAs IR LED, diode or solid-state lasers as well as for use in infrared microscopy, infrared luminescence, examination of documents, forensics, art restoration and etc.


The camera is based on a high-sensitive low-noise silicon CCD sensor and two-photon absorption phenomenon. Superior image quality is obtained with micro lens system and special coating layer on a silicon.

Typical applications

  • Laser alignment and safety
  • (IR) Infrared viewer is ideal for alignment of infrared laser beam and optical components in near infrared systems.
  • Semiconductors inspection
  • With a microscope adapter IR viewer can be used to view through the surface of silicon and gallium arsenide wafers.
  • Forensics and art restoration
  • Photo processing
  • Thermal imaging

Technical information

Spectral sensitivity 400-1700nm
Sensor size 1/3 inches, 6.0mm x 4,96mm
Max. resolution 570 TV lines
Resolution at max. Sensitivity 135 TV lines
Lens F1.4/26mm, C-mount
Field of view 10°
Focusing range 0.2m (or 0.08m)* to inf
Ratio signal-to-noise 48 Db
Gamma 0.45
Video output CCIR Standart composite video
Power supply DC 10… 14V, 150mA
Temperature range +5… +40°C
Weight 0,23 kg
Dimensions 50x58x90 mm

* with the distance ring